Load Sequence Effect and Enhanced Life Prediction under Spectrum Loading

Lead academic: Dr Y Xu

Supporting Academic: Dr W. Tiu, Dr Y Chen

Research Student: L Wang

Funding: £50,000

Funding body: de Havilland Trust and Airbus UK Ltd

Period: August 2005 – May 2009

The project aimed at gaining a further scientific understanding of the complex influence of loading history on the fatigue crack growth. It focused on the identification of the effective fatigue crack growth driving force using both the experimental and the finite element simulation approaches.

Near-tip crack behaviour under the spectrum loading was investigated in detail. The crack closure concept was be used to separate the extrinsic and intrinsic resistance to fatigue crack growth.

The results were essential in developing an enhanced fatigue life prediction model under spectrum loading.

Image: Fractographic features of the fatigue crack surface after a 100% single overload.